Systems and methods for determining patient temperature

ABSTRACT

A temperature probe includes a handle and a shaft extending from the handle. The shaft includes a distal end, a proximal end, and a tip at the distal end. The temperature probe also includes a capacitance sensor disposed on one of the handle and the shaft, the capacitance sensor configured to measure a change in capacitance when positioned proximate a conductor. The temperature probe further includes a temperature sensor disposed on the shaft, the temperature sensor configured to measure a body cavity temperature of a patient.

CROSS-REFERENCE TO RELATED APPLICATIONS

The present application is a continuation-in-part of U.S. patentapplication Ser. No. 13/423,785 entitled SYSTEMS AND METHODS FORDETERMINING PATIENT TEMPERATURE, filed Mar. 19, 2012, the entiredisclosure of which is incorporated herein by reference.

FIELD OF THE INVENTION

The present disclosure relates to systems and methods for temperaturedetermination and, in particular, to systems and methods for temperaturemeasurement site determination.

BACKGROUND OF THE INVENTION

Measuring patient temperature is a common first step in diagnosingillnesses. Physicians commonly use a variety of methods for determiningpatient temperature, including, for example, obtaining temperaturemeasurements with a thermometer. While thermometers utilizing mercuryhave been in existence for many years, modern thermometers typicallyemploy one or more electronic sensors configured to measure patienttemperature. Such sensors may take one or more measurements over arelatively short period of time. Based on these measurements, thethermometer may generate a predicted internal and/or core temperature ofthe patient. In generating this predicted temperature, it is commonpractice to insert at least a portion of the thermometer into a coverprior to taking temperature measurements. Known thermometers may thensense the ambient temperature of a body cavity of the patient, and mayuse this sensed ambient temperature in determining a patient's coretemperature.

However, determining a patient's core temperature as described above canproduce inaccurate results. For example, due to inherent variations inthe manufacturing process, the covers utilized with such thermometersoften have thicknesses that vary within a certain tolerance range.Although the variations in probe cover thickness can be a source ofsignificant error in the core temperature determination, it can bedifficult and expensive to manufacture probe covers within a relativelynarrow thickness tolerance range. Thus, in an effort to minimize theeffect of such error, modern thermometers may utilize algorithms thatmake predetermined estimates to compensate for these thicknessvariations. Compensating for such variations in this way may, however,introduce additional error into the core temperature determination,thereby further reducing the accuracy of such determinations.

Such thermometers are typically not configured to determine a variety ofother conditions that contribute to the accuracy of the temperaturedetermination. For instance, such thermometers are generally notconfigured to determine whether a probe cover has been installedthereon, or, once a probe cover has been installed, whether theinstalled probe cover is of an appropriate type. Additionally, suchthermometers are not typically configured to determine a proximity tothe body cavity or other measurement site of the patient, whichmeasurement site is being utilized for the temperature measurement, oran insertion depth of the thermometer at the measurement site. Sinceknown thermometers are not configured to determine such additionalconditions, the algorithms utilized in the core temperaturedetermination are limited in their sensitivity.

The exemplary embodiments of the present disclosure are directed towardovercoming the deficiencies described above.

SUMMARY

In an exemplary embodiment of the present disclosure, a temperatureprobe includes a handle and a shaft extending from the handle. The shaftincludes a distal end, a proximal end, and a tip at the distal end. Thetemperature probe also includes a capacitance sensor disposed on one ofthe handle and the shaft, the capacitance sensor configured to measure achange in capacitance when positioned proximate a conductor. Thetemperature probe further includes a temperature sensor disposed on theshaft, the temperature sensor configured to measure a body cavitytemperature of a patient.

In another exemplary embodiment of the present disclosure, a method ofdetermining a core temperature of a patient includes determining a firstcapacitance with a capacitance sensor of a temperature probe,determining a difference between the first capacitance and a knowncapacitance stored in a memory associated with the temperature probe,and inserting a portion of the temperature probe into a body cavity ofthe patient. The method also includes measuring a body cavitytemperature of the patient with the temperature probe, and calculatingthe core temperature of the patient based on the difference and the bodycavity temperature.

In a further exemplary embodiment of the present disclosure, atemperature measurement system includes a storage container having afront, a back, at least two sides, a top, and a bottom wall disposedopposite the top. The front, back, and at least two sides are disposedorthogonal to the bottom wall, and the top includes an opening. Thesystem also includes a conductor disposed on the bottom wall, and aplurality of probe covers disposed within the storage container andaccessible for removal through the opening. A distal end of each probecover of the plurality of probe covers contacting the conductor on thebottom wall prior to removal from the storage container.

In another exemplary embodiment of the present disclosure, a temperatureprobe includes a shaft having a distal end, a proximal end, and a tip atthe distal end. The temperature probe also includes a first sensordisposed on the shaft. The first sensor is configured to generate afirst signal indicative of at least one of a proximity to a measurementsite of a patient and an identity of the measurement site. Thetemperature probe further includes a second sensor disposed on theshaft. The second sensor is configured to generate a second signalindicative of a temperature associated with the measurement site. Thetemperature probe also includes a controller in communication with thefirst and second sensors. The controller is configured to receive thefirst and second signals, and to determine a core temperature of thepatient based on the first and second signals.

In an additional exemplary embodiment of the present disclosure, amethod of determining a core temperature of a patient includesdetermining, with a first sensor, a parameter associated with ameasurement site of the patient, wherein the parameter includes at leastone of a change in capacitance and a change in an amount of radiationreceived by the first sensor. The method also includes determining atleast one of a proximity to the measurement site and an identity of themeasurement site based on the parameter. The method further includesdetermining, with a second sensor, a temperature associated with themeasurement site. The method also includes determining the coretemperature of the patient based on the temperature associated with themeasurement site, and the at least one of the proximity to themeasurement site and the identity of the measurement site.

In yet another exemplary embodiment of the present disclosure, a methodof determining a core temperature of a patient includes inserting ashaft of a temperature probe into a probe cover disposed within astorage container, measuring a first change in light received by a firstsensor disposed on the shaft resulting from the shaft being insertedinto the probe cover, and measuring a second change in light received bythe first sensor resulting from the shaft being removed from the storagecontainer with the probe cover disposed on the shaft. The method alsoincludes measuring a third change in light received by the first sensorresulting from the shaft and the probe cover being disposed proximate ameasurement site of the patient, and measuring a temperature associatedwith the measurement site with a second sensor disposed on the shaft.The method further includes determining the core temperature based onthe temperature associated with the measurement site, and a parameterdetermined based on the third change in light received by the firstsensor. In such an exemplary embodiment, such a parameter may include,for example, among other things, an identity of the measurement site, aproximity to the measurement site, the presence of the probe cover onthe shaft, a probe cover type, a depth of insertion of the probe at themeasurement site, and/or any other like parameter.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 illustrates a temperature probe of an exemplary temperaturemeasurement system.

FIG. 2 illustrates a capacitance plot according to an exemplaryembodiment of the present disclosure.

FIG. 3 illustrates a storage container of an exemplary temperaturemeasurement system.

FIG. 4 is a cutaway view of a portion of the storage container shown inFIG. 3.

FIG. 5 illustrates a capacitance plot according to another exemplaryembodiment of the present disclosure.

FIG. 6 illustrates a user station of an exemplary temperaturemeasurement system.

FIG. 7 illustrates a cutaway view of a portion of the user station shownin FIG. 6.

FIG. 8 illustrates a capacitance plot according to a further exemplaryembodiment of the present disclosure.

FIG. 9 illustrates a partial view of a temperature probe according toanother exemplary embodiment of the present disclosure.

FIG. 10 illustrates a partial view of a mouth of a patient according toan exemplary embodiment of the present disclosure.

FIG. 11 illustrates a temperature probe of another exemplary temperaturemeasurement system.

FIG. 12 illustrates an exemplary capacitance plot associated with thesystem shown in FIG. 11.

FIG. 13 illustrates a temperature probe of further exemplary temperaturemeasurement system.

FIG. 14 illustrates an exemplary voltage plot associated with the systemshown in FIG. 13.

FIG. 15 illustrates another exemplary voltage plot associated with thesystem shown in FIG. 13.

DETAILED DESCRIPTION

FIG. 1 illustrates an exemplary temperature probe 10 of the presentdisclosure. It is understood that the implementation of the disclosedtechnology in a temperature probe is merely exemplary. The disclosedtechnology may be applicable to any other probes, speculums, endoscopes,and/or other medical devices using a sheath and/or cover to protect thedevice from contaminants present on a surface and/or within a bodycavity, where the characteristics of the sheath/cover affect theaccuracy of the gathered data. Additionally, wherever possiblethroughout the present disclosure, like item numerals have been used toidentify like components.

The temperature probe 10 may include, for example, a shaft 18 extendingfrom a handle 20. A distal end 15 of the shaft 18 may define a distalend 12 of the temperature probe 10, and the handle 20 may define aproximal end 14 of the probe 10. The shaft 18 may also define a tip 16disposed at the distal end 15. The tip 16 may be sufficiently rounded,atraumatic, and/or otherwise configured so as not to cause injury to apatient upon contact with a body surface and/or at least partialinsertion of the shaft 18 within one or more body cavities of thepatient. As used herein, the term “patient” may include any human actingto measure his/her own temperature (such as by using a temperature probe10 without interaction from a healthcare professional), or any human oranimal whose temperature is being measured. In an exemplary embodimentin which the temperature probe 10 is utilized to sense, measure,calculate, and/or otherwise determine a temperature of the patient, itis understood that such body cavities may include the mouth, rectum,axilla, ear drum, and/or other known measurement sites from which atemperature may be sensed. The shaft 18 and/or the handle 20 may be madefrom any material and/or combinations of materials commonly used inmedical and/or examination procedures. Such materials may include, forexample, plastics, polymers, composites, stainless steel, and/or anyother like materials. Such materials may be suitable for repeated useand/or repeated sanitation. Accordingly, in an exemplary embodiment ofthe present disclosure, the temperature probe 10 and/or its componentsmay be substantially waterproof. One or more waterproof seals may beincluded and/or otherwise utilized with components of the temperatureprobe 10 to facilitate such repeated sanitation and/or use.

The handle 20 may include one or more operator interfaces 22. Suchoperator interfaces 22 may be configured to assist in performing one ormore functions of the temperature probe 10. For example, the operatorinterfaces 22 may comprise any combination of switches, buttons, levers,knobs, dials, keys, and/or other like components configured to activate,deactivate, manipulate, and/or otherwise control components of thetemperature probe 10. Such operator interfaces 22 may, for example,assist the user in toggling through and/or selecting one or more modesof operation of the temperature probe 10, enabling and/or disabling oneor more alarms or signals associated with operation of the probe 10,initiating a single substantially instantaneous temperaturedetermination, initiating a substantially continuous and/or repeatingtemperature determination, and/or other like modes, functions, oroperations.

In an exemplary embodiment, at least one of the operator interfaces 22may comprise an ejector mechanism 26 disposed at the proximal end 14 ofthe temperature probe 10. As will be described in greater detail below,at least a portion of the temperature probe 10 may be inserted into aprobe cover 30 before and/or during use, and such an ejector mechanism26 may be configured to assist in removing the probe cover 30 from thetemperature probe 10. In an exemplary embodiment, actuating the ejectormechanism 26 may extend the shaft 18, in the direction of arrow 50, adesired distance from a base 24 formed at a proximal end 13 of the shaft18. Extending the shaft 18 in this way may eject and/or otherwise removea probe cover 30 from the shaft 18. In particular, extending the shaft18 in the direction of arrow 50 may overcome a retention force providedby one or more shoulders, rings, tabs, extensions, and/or other likestationary retention components 27 of the temperature probe 10. Suchstationary retention components 27 may be disposed, for example,proximate the base 24.

In further exemplary embodiment, the ejector mechanism 26 may beoperably connected to one or more moveable components disposed at or onthe base 24. In such exemplary embodiments, actuating the ejectormechanism 26 may move one or more such components in the direction ofarrow 50 to assist in removing the probe cover 30 from the shaft 18. Forexample, such moveable components may comprise one or more fingers,hooks, shoulders, arms, tabs, rings, and/or other like moveablecomponents configured to assist in ejecting the probe cover 30 from thebase 24 of the shaft 18 after use. Such components may be movable withrespect to, for example, the base 24 and/or the shaft 18, and suchcomponents may be movable in, for example, a direction substantiallyparallel to the shaft 18. In additional exemplary embodiments, suchcomponents may be movable in an arcuate path relative to the shaft 18.Movement of such components may assist in bending, flexing, and/orotherwise deforming at least a portion of the probe cover 30. Forexample, such components may be movable along one or more surfaces ofthe probe cover 30, and such movement may assist in flexing at least aportion of the probe cover 30. Such flexing may ultimately overcome aretention force provided by one or more of the retention components 27described above, thereby releasing the probe cover 30 from thetemperature probe 10.

In additional exemplary embodiments, one or more operator interfaces 22may be configured to assist in controlling one or more correspondingsensors associated with the temperature probe 10. For example, theoperator interfaces 22 may be operably connected to one or more sensors32, 34, 35 disposed on the handle 20 and/or the shaft 18. For example,in the embodiment shown in FIG. 1, the operator interfaces 22 may beoperably connected to first and second sensors 32, 34. Likewise, asshown in the exemplary embodiment of FIG. 11, the operator interfaces 22may be operably connected to first sensor 32 and each of the secondsensors 34. Additionally, as shown in the exemplary embodiment of FIG.13, the operator interfaces 22 may be operably connected to first sensor32 and each of the third sensors 35. It is understood that additionalexemplary embodiments of the temperature probe 10 described herein mayinclude any desired number and/or combination of sensors 32, 34, 35, andthat one or more operator interfaces 22 may be operably connected tosuch sensors 32, 34, 35. In any of the exemplary embodiments describedherein, the temperature probe 10 may include greater than or less thanthree sensors 32, 34, 35 as desired.

In exemplary embodiments, the first, second, and/or third sensors 32,34, 35 may be embedded within and/or otherwise formed integrally withthe shaft 18. In such exemplary embodiments, the sensors 32, 34, 35 maybe positioned just beneath an outer surface of the shaft 18 such thatthe shaft 18 may retain a substantially smooth, substantiallycylindrical shape. In such exemplary embodiments, it is understood thatthe sensors 32, 34, 35 may be electrically, operably, and/or otherwiseconnected to the operator interfaces 22 and/or other components of thetemperature probe 10 via wireless or electrical connections embeddedwithin and/or running along a length of the shaft 18 beneath the outersurface of the shaft 18.

In an exemplary embodiment, one or more of the sensors 32, 34, 35 maycomprise any type of temperature, capacitance, optical, radiation,proximity, and/or other like sensor known in the art. For example, thesensors 32, 34, 35 may be the same type of sensor. Alternatively, thesensors 32, 34, 35 may comprise different types of sensors configured tosense one or more different characteristics of a patient. In anexemplary embodiment, at least one of the first, second, and/or thirdsensors 32, 34, 35 may comprise a thermocouple and/or a thermistorconfigured to sense a temperature associated with such a patient. Forexample, such a sensor may be configured to measure a temperature of thebody cavity and/or other like measurement site into which thetemperature probe 10 has been inserted. For example, in embodiments inwhich the shaft 18 of the temperature probe 10 is inserted into themouth of the patient, such a sensor may be utilized to measure atemperature of a mouth surface. Such a sensor may also be configured tomeasure a temperature of the measurement site proximate to which thetemperature probe 10, or a component thereof, has been disposed.

At least one of the sensors 32, 34, 35 may also comprise an infraredtemperature sensor, such as, for example, a thermopile and/or other likeinfrared-based temperature-sensing components. Such a sensor may beconfigured to convert thermal energy into electrical energy, and maycomprise two or more thermocouples connected in series or in parallel.Such components may be configured to generate an output voltageproportional to a local temperature difference and/or temperaturegradient. In an exemplary embodiment in which the one or more of thesensors 32, 34, 35 comprise a thermopile, the temperature probe 10 maycomprise, for example, an infrared temperature probe and/or other likeinfrared thermometer.

In such embodiments, an exemplary infrared temperature probe 10 mayutilize at least a portion of the thermal radiation emitted by thepatient, the body cavity, and/or the measurement site of the patient,into which the temperature probe 10 has been inserted, or proximate towhich the temperature probe 10 has been disposed, in order to estimate,infer, calculate, and/or otherwise determine a core temperature of apatient temperature. Such an exemplary temperature probe 10 may utilizesignals received by at least one of the sensors 32, 34, 35 to determinean amount of infrared radiation emitted by the patient. Using a knowntransmissivity and/or other characteristic of the patient, such infraredtemperature probes 10 may be capable of determining a temperature of thepatient, including a body cavity temperature of the patient and/or acore temperature of the patient.

In a further exemplary embodiment, at least one of the sensors 32, 34,35 may comprise a capacitance sensor configured to measure a capacitanceand/or a change in capacitance. For example, in an embodiment in whichthe first sensor 32 comprises a temperature sensor, the second sensor 34may comprise a capacitance sensor configured to measure a capacitanceand/or a change in capacitance when the sensor 34 is positionedproximate a conductor. As shown in FIG. 1, in exemplary embodiments, theprobe 10 may include a capacitance sensor 34 disposed proximate thedistal end 15 of the shaft 18, such as, proximate the tip 16.Alternatively, as shown in FIG. 11, the probe 10 may include one or morecapacitance sensors 34 disposed at various locations on and/or along theshaft 18. In the exemplary embodiment of FIG. 11, a first capacitancesensor 34 may be disposed on the shaft 18 proximate the tip 16, and atleast one additional capacitance sensor 34 may be disposed on the shaft18 proximal to the first capacitance sensor 34. In such embodiments, forexample, the first capacitance sensor 34 disposed proximate the tip 16may be configured to determine a first depth of insertion of the shaft18 at the measurement site of the patient. Likewise, each additionalcapacitance sensor 34 disposed proximal to the first capacitance sensor34 may be configured to determine respective depths of insertion greaterthan the first depth of insertion determined by the first capacitancesensor 34. It is understood that such respective depths of insertion maybe determined by the capacitance and/or the change in capacitancedetermined by the one or more capacitance sensors 34. The graduatedcapacitance sensors 34 shown in FIG. 11 may also provide a user of theprobe 10 with visual indicia of insertion depth. In the exemplaryembodiment of FIG. 11, at least one of the capacitance sensors 34 may besubstantially ring-shaped, and may extend around substantially an entireouter surface and/or circumference of the shaft 18. Alternatively, inadditional exemplary embodiments, one or more of the capacitance sensors34 described herein may be substantially linear. In such embodiments(not shown), the capacitance sensors 34 may extend substantiallylongitudinally along a length of the shaft 18. For example, such sensors34 may extend along an outer surface of the shaft in the direction ofarrow 50. Such substantially linear capacitance sensors 34 may belocated at staggered and/or graduated locations along the length of theshaft 18 to provide a user of the probe 10 with visual indicia ofinsertion depth. Capacitance sensors 34 disposed at such graduatedlocations may be configured to determine respective depths of probeinsertion as described above. Alternatively, such substantially linearcapacitance sensors 34 may have different respective lengths. Forexample, a first substantially linear capacitance sensor 34 may have afirst length, a second substantially linear capacitance sensor 34disposed adjacent to the first linear capacitance sensor 34 may have asecond length greater than the first length, and a third substantiallylinear capacitance sensor 34 disposed adjacent to the second linearcapacitance sensor 34 may have a third length greater than the secondlength. In such embodiments, the different lengths of the respectivelinear capacitance sensors 34 may assist in determining differentrespective depths of probe insertion and may also provide a user withvisual indicia of insertion depth. In each of the above embodiments,such substantially linear capacitance sensors 34 may also be employed toassist in determining the identity of the measurement site through anyof the methods described herein.

The various capacitance sensors 34 described herein may comprise anytype of sensor configured to detect a conductive substance or othersubstance having a dielectric constant different than that of air. Forexample, such a capacitance sensor 34 may include a first conductivelayer made from copper, indium tin oxide, silver, carbon, printed ink,and/or any other known conductive material. During use, a voltage may beapplied to the conductive layer, resulting in the formation of anelectric field extending from the conductive layer. When a conductor isdisposed within the electric field, a capacitor is formed, and thecapacitance sensor 34 may measure a change in capacitance resulting fromthe presence of the conductor within the electric field. For example,the capacitance may change as the distance between the conductive layerof the capacitance sensor 34 and the conductor changes. The capacitancesensor 34 may be configured to generate one or more signals indicativeof such a capacitance and/or such a change in capacitance, and thechange in capacitance may be based on the distance between thecapacitance sensor 34 and the conductor.

A variety of converters and/or other known electrical components may beused with the capacitance sensors 34 of the present disclosure tocondition and/or interpret the signal generated by the capacitancesensor 34. For example, the sensors 32, 34, 35 may be operably,controllably, electrically, and/or otherwise connected to a controller52, and such a converter may be a software and/or hardware component ofthe controller 52. In such an exemplary embodiment, the controller 52may be configured to assist in calculating and/or otherwise determininga core temperature of a patient based on the temperature measurements,capacitance measurements, voltages, radiation measurements, lightmeasurements, and/or other measurements made by the first, second,and/or third sensors 32, 34, 35. In exemplary embodiments, suchconverters may convert the capacitive input signals generated by thecapacitance sensor 34 into digital values or “counts” representative ofthe measured capacitance.

As will be described in greater detail below, FIGS. 2, 5, 8, and 12illustrate various capacitance plots of the present disclosure in whichexemplary count values are shown for purposes of discussion. Asexemplified by FIGS. 2, 5, 8, and 12, count value (i.e., measuredcapacitance) changes are based on the proximity of the capacitancesensor 34 to the conductor. For example, the measured capacitance mayhave its highest value (for example, 700 counts) when the capacitancesensor 34 is placed in direct contact with the conductor and no probecover 30 is disposed on the shaft 18. Such a capacitance value may bestored within a memory of the controller 52 and may be utilized as aknown reference value for determining, for example, the presence and/orabsence of a probe cover 30 disposed on the shaft 18. Such a capacitancevalue may also be used to determine the thickness, type, and/or othercharacteristics of one or more probe covers 30 disposed on the shaft 18.

The measured capacitance may decrease as the conductor is spaced and/orseparated from the capacitance sensor 34, such as by a probe cover 30.Thus, in further embodiments, such measured capacitance values may beused to determine a proximity of the temperature probe 10 (i.e., aproximity of the capacitance sensor 34) to a measurement site of thepatient. Such proximity to the measurement site may be determined, forexample, prior to contact between the shaft 18 (with or without a probecover 30 disposed thereon) and the measurement site. For example, such aproximity to the measurement site may be determined while a probe cover30 is disposed on the shaft 18 and prior to insertion of the shaft, orportions thereof, within a body cavity of the patient. As shown in FIGS.2, 5, 8, and 12, the measured capacitance may vary based on thethickness of the probe cover 30 being used, and the use of a thickerprobe cover 30 may result in a lower capacitance value than the use of arelatively thinner probe cover 30. Thus, such measured and knowncapacitance values may be used by the controller 52 to determine anunknown thickness of a probe cover 30 being used.

In still further exemplary embodiments, the capacitance sensors 34illustrated in FIGS. 1 and 11 may be configured to determine acapacitance value and/or a change in capacitance associated with themeasurement site, and the controller 52 may be configured to determinean identity of the measurement site based on one or more such values.For example, as will be described in greater detail below with respectto FIG. 12, the controller 52 may be configured to determine theidentity of the measurement site (i.e., whether the measurement sitecomprises the mouth, the axilla, the rectum, ear drum, and/or any otherlike measurement site of the patient) based on a correlation between achange in capacitance measured by the one or more capacitance sensors 34and a known change in capacitance and/or a known capacitance valueassociated with each respective measurement site. Such known capacitancevalues or change in capacitance values may be stored in, for example, amemory of the controller 52. In further exemplary embodiments, thecontroller 52 may be configured to determine the identity of themeasurement site by, among other things, determining differences betweena capacitance value, determined by one or more of the capacitancesensors 34, associated with the measurement site, and a plurality ofsuch known capacitance values. Once such differences have beendetermined, the controller 52 may select one of the respective potentialmeasurement sites of the patient corresponding to the smallestdetermined difference.

The conductors described above may comprise any conductive materialand/or structure known in the art. In some embodiments, the body cavityand/or other measurement site of the patient from which a body cavitytemperature is determined may be a conductor affecting the capacitancemeasured by the sensor 34. For example, in embodiments in which a bodycavity temperature is measured by inserting the shaft 18 into thepatient's mouth, the conductor may comprise the patient's tongue and/orother parts of the patient's mouth. As shown in FIGS. 4 and 7, infurther exemplary embodiments, a conductor 74 may comprise a metallicsheet, film, plate, layer, coating, and/or other like structure. As willbe described in greater detail below with respect to FIGS. 3 and 4, sucha conductor 74 may be disposed within a storage container 58 housing oneor more probe covers 30.

Alternatively, in exemplary embodiments in which the storage container58 is disposed within a receptacle 84 of a user station 78 (FIG. 6),such a conductor 74 may be disposed on a base 86 (FIG. 7) of thereceptacle 84, and external to the storage container 58. Such a userstation 78 may include one or more operator interfaces 80 configured forcommunication with the temperature probe 10 and/or the controller 52.Such a user station 78 may also include one or more additionalreceptacles 82 for storing the temperature probe 10 and/or thecontroller 52.

FIG. 7 illustrates a cutaway view of a portion of an exemplaryreceptacle 84 having a storage container 58 disposed therein. Thereceptacle 84 may include one or more walls extending orthogonal fromthe base 86, and the base 86 may include an inner surface 88 and anouter surface 90. Although FIG. 7 illustrates the conductor 74 beingdisposed on the inner surface 88, in further exemplary embodiments, theconductor 74 may be disposed on the outer surface 90 and/or on one ormore of the walls extending from the base 86. In still further exemplaryembodiments, the conductor 74 may be formed integrally with the base 86,and in such exemplary embodiments, the base 86 may be formed from one ormore metallic and/or other conductive materials to provide thefunctionality of the conductors 74 described herein. Likewise, althoughFIG. 4 illustrates the conductor 74 being disposed on a bottom wall 64of the storage container 58, in additional exemplary embodiments, theconductor 74 may be formed integrally with the bottom wall 64 and/orother components of the storage container 58. In such exemplaryembodiments, the bottom wall 64 and/or other components of the storagecontainer 58 may be formed from one or more metallic and/or otherconductive materials to provide the functionality of the conductors 74described herein.

In still further exemplary embodiments, the conductor 74 may comprise ametallic and/or otherwise conductive ring disposed proximate thecapacitance sensor 34. For example, as shown in FIG. 9, the capacitancesensor 34 may be disposed proximate the proximal end 13 of the shaft 18,and the ring-shaped conductor 74 may encircle at least a portion of theproximal end 13. In such exemplary embodiments, the conductor 74 may beconnected to the temperature probe 10 in any known way, and theconductor 74 may be spaced from the outer surface of the shaft 18 suchthat a probe cover 30 may be disposed on the shaft 18 and/or removablyconnected to the shaft 18 without interference from the conductor 74.For example, such an exemplary ring-shaped conductor 74 may be connectedto the handle 20 and/or the shaft 18 by one or more conductive ornon-conductive mounts 76 extending from the temperature probe 10. Themount 76 may assist in spacing the conductor 74 from the outer surfaceof the shaft 18 such that the probe cover 30 may be disposed on theshaft 18 between the conductor 74 and a portion of the capacitancesensor 34. In such exemplary embodiments, the conductor 74 may overlaythe portion of the capacitance sensor 34, and may be disposed within anelectric field generated by the capacitance sensor 34 during use. Thus,disposing the probe cover 30 between the capacitance sensor 34 and thering-shaped conductor 74 may change the capacitance value measured bythe capacitance sensor 34. For example, disposing a thicker probe cover30 on the shaft 18 between the capacitance sensor 34 and the ring-shapedconductor 74 may result in a lower measured capacitance value than theuse of a relatively thinner probe cover 30.

Thus, as described above, the signal generated by the capacitance sensor34 may be indicative of the thickness of the probe cover 30 disposed onthe shaft 18 and, in particular, may be indicative of the change incapacitance sensed by the capacitance sensor 34. This change incapacitance may be based on the distance between the capacitance sensor34 and the conductor 74. As shown in FIG. 4, this change in capacitancemay result from the capacitance sensor 34 being spaced from theconductor 74 by a probe cover 30 in contact with both the distal end 15of the shaft 18 and the conductor 74. As shown in FIG. 7, such a changein capacitance may also result from the capacitance sensor 34 beingspaced from the conductor 74 by both a probe cover 30 and the bottomwall 64 of the storage container 58. Moreover, as shown in FIG. 9, sucha change in capacitance may also result from the probe cover 30 beingdisposed between the conductor 74 and the capacitance sensor 34. Becausethe probe cover 30 may have a different dielectric constant than air,the probe cover 30 may attenuate the corresponding measured capacitancevalue.

In still further exemplary embodiments, at least one of the sensors 32,34, 35 may comprise an optical sensor configured to determine an amountof radiation received thereby and/or a change in an amount of radiationreceived. For example, in an embodiment in which the first sensor 32comprises a temperature sensor, the third sensor 35 may comprise anoptical sensor configured to measure a change in an amount of radiationreceived by the optical sensor 35 as the sensor 35 approaches and/or ispositioned proximate a measurement site of the patient. Such an opticalsensor 35 may comprise, for example, a photodiode and/or any other typeof like sensor configured to detect, measure, sense, and/or otherwisedetermine an amount of radiation received and/or a change in the amountof radiation received. It is understood that such radiation may comprisevisible light and/or other radiation, such as x-ray, infrared, and/orother radiation outside of the optical band. The optical sensor 35 maybe configured to generate a signal indicative of the amount of radiationreceived and/or the change in the amount of radiation received, and maybe configured to direct such signals to the controller 52 describedabove. As will be described in greater detail below with respect toFIGS. 14 and 15, such signals may comprise a voltage value and/or otherlike value indicative of the amount of radiation received by the sensor35.

Upon receiving one or more signals from the sensor 35, the controller 52may be configured to determine at least one of a proximity to themeasurement site and an identity of the measurement site. Additionally,the controller 52 may be configured to determine the presence of a probecover 30 disposed on the shaft 18, and/or a probe cover type associatedwith the probe cover 30, based on the one or more signals. As describedabove, the controller 52 may be configured to assist in calculatingand/or otherwise determining a core temperature of a patient based ontemperature measurements made by first sensor 32 and radiationmeasurements made by third sensor 35. In exemplary embodiments, thecontroller 52 may convert the radiation input signals generated by theoptical sensor 35 into voltage values representative of the amount ofradiation received by the optical sensor 35 and/or the change inradiation received thereby.

As will be described in greater detail below, FIGS. 14 and 15 illustratevarious voltage plots of the present disclosure in which exemplaryvoltages are shown for purposes of discussion. As exemplified by FIGS.14 and 15, controller 52 may convert the signals received from theoptical sensor 35 into corresponding voltage values indicative of theamount of radiation received by the sensor 35 at the measurement site,and changes in the amount of radiation received by the sensor 35 maycorrespond to changes in such voltage values. For example, the measuredradiation may correspond to a relatively high voltage value (forexample, 1.0 volt) when the optical sensor 35 is exposed to ambientlight away from the measurement site and no probe cover 30 is disposedon the shaft 18. Such a voltage value may be stored within a memory ofthe controller 52 and may be utilized as a known reference value fordetermining, for example, the presence, type, and/or othercharacteristics of one or more probe covers 30 disposed on the shaft 18.Such a voltage value may also be utilized as a known reference value fordetermining a proximity of the probe 10 (i.e., a proximity of theoptical sensor 35) to the measurement site and/or an identity of themeasurement site.

At least one of the sensors 32, 34, 35 may additionally include at leastone window, lens, and/or other like optical component 36 positionedproximate thereto. For example, such an optical component 36 may bedisposed substantially flush and/or coplanar with the outer surface ofthe shaft 18. In an exemplary embodiment in which the shaft 18 issubstantially cylindrical, such an optical component 36 may besubstantially curved so as to match the radius of curvature of the shaft18. Such optical components 36 may assist in, for example, focusingand/or transmitting infrared radiation between the thermopile and thebody cavity of the patient. Such optical components 36 may also assistin protecting the thermopile, thermocouple, thermistor, capacitancesensor, optical sensor, photodiode, and/or other sensor componentsduring use of the temperature probe 10, and may assist in forming asubstantially fluid tight compartment within the shaft 18 so as toprotect sensor components from contact with bodily fluids, cleaningsolutions, and/or other liquids. It is understood that such opticalcomponents 36 may be substantially transparent to assist in thetransmission of infrared radiation. Such optical components 36 may alsobe highly electrically and/or optically transmissive, and may have anegligible effect on, for example, an electric field generated by one ormore of the sensors 32, 34, 35. Likewise, such optical components 36 mayassist in transmitting visible and/or other like radiation to one ormore of the sensors 32, 34, 35.

The handle 20 may also include one or more displays 54 operablyconnected to the controller 52. The display 54 may comprise, forexample, a liquid crystal display (LCD) screen, a light emitting diode(LED) display, a digital read-out, and/or any other like componentsconfigured to communicate information to the user of the temperatureprobe 10. Such displays 54 may be configured to indicate, for example,one or more temperatures measured by the sensors 32, 34; 35, one or morecapacitance values and/or changes in capacitance measured by the sensors32, 34; 35, one or more values indicative of an amount of radiationreceived by the sensors 32, 34, 35, one or more values indicative of achange in the amount of radiation received by the sensors 32, 34, 35,one or more temperatures determined based on signals received from theone or more sensors 32, 34, 35, and/or any other information that may beuseful during operation of the temperature probe 10. Such otherinformation may include, for example, the proximity of the probe 10,and/or components thereof, to the measurement site, the depth ofinsertion of the shaft 18 within the measurement site, and the identityof the measurement site. The display 54 may be configured to communicatesuch information substantially instantaneously and/or substantiallycontinuously, depending on the mode of operation of the temperatureprobe 10. Such a display 54 may also indicate whether or not thetemperature probe 10 is turned on and whether a probe cover 30 has beenconnected to the temperature probe 10. The display 54 may also beconfigured to indicate the mode of operation of the temperature probe 10(for example, continuous or instantaneous modes of temperaturecalculation), as well as whether one or more threshold temperatures,threshold temperature change rates, and/or other sensed metricthresholds have been met or exceeded. The display 54 may be, forexample, a substantially numerical digital display, and may also beconfigured to display any other typical operating information, such as,for example, a temperature versus time trend line or other graphicaldepictions. Such graphical depictions may also include one or morecapacitance plots of the type illustrated in FIGS. 2, 5, 8, and 12.

The temperature probe 10 may also include one or more signal devices(not shown) operably connected to the controller 52. Such signal devicesmay include, for example, one or more lights, LEDs, speakers, and/orother like devices configured to emit an audible and/or optical alarm orsignal in response to a command or signal from the controller 52. Suchan alarm or other signal may be initiated by, for example, thecontroller 52 when the calculated temperature meets or exceeds athreshold temperature. Such an alarm and/or other signal may also beinitiated by the controller 52 based on a determined proximity to themeasurement site, a depth of insertion, an identity of the measurementsite, and/or other determinations made by the controller 52. Forexample, such alarms or other signals may be initiated in response tomeeting or exceeding one or more predetermined thresholds associatedwith such determinations. In additional exemplary embodiments, such analarm or signal may be initiated during a substantially continuoustemperature calculation operation where the rate of patient temperaturechange meets or exceeds a predetermined temperature change ratethreshold. In additional exemplary embodiments, such signal/devices maybe disposed on and/or otherwise associated with the controller 52.

The controller 52 may be operably connected to the operator interfaces22, display 54, sensors 32, 34, 35, and/or other components of thetemperature probe 10, and the controller 52 may be configured to controlthe operation of such components. In an exemplary embodiment, thecontroller 52 may be configured to receive signals, information,measurements, and/or other data from the sensors 32, 34, 35 of thetemperature probe 10, and to estimate, calculate, and/or otherwisedetermine a core temperature of the patient based on the informationreceived. The controller 52 may also be configured to execute one ormore commands and/or control programs. For example, the controller 52may be programmed to initiate one or more alarms in response tocalculating a core temperature that is greater than or equal to apredetermined threshold temperature. In an exemplary embodiment, such athreshold temperature may be approximately 100° F. In addition, thecontroller 52 may be configured to initiate such an alarm during asubstantially continuous temperature calculation operation if thecalculated temperature increases and/or decreases at a rate that isgreater than or equal to a predetermined threshold temperature changerate. The controller 52 may comprise a processor, memory, and/or otherknown controller components to facilitate the functionality describedherein.

In an exemplary embodiment, the controller 52 may be disposed within,for example, the handle 20 of the temperature probe 10. In such anembodiment, the controller 52 may be formed substantially integral withthe temperature probe 10. For example, the handle 20 may form one ormore substantially watertight and/or substantially hermetically sealedcompartments for storing the various components of the controller 52.Alternatively, as shown in FIGS. 1, 11, and 12, the controller 52 may beformed separately from the temperature probe 10. In such exemplaryembodiments, the controller 52 may comprise a housing that is formedseparate from the handle 20. To facilitate communication between thetemperature probe 10 and the controller 52 in such embodiments, thecontroller 52 may be operably connected to the temperature probe 10 viaone or more wires, cables, USB connection, Bluetooth, WiFi, radio,and/or other known hard-wired and/or wireless communication protocols.The controller 52 and/or the temperature probe 10 may further includeany number of ports, connectors, transponders, receivers, antennae,and/or other known components to facilitate such connectivity and/orcommunication. As shown in FIG. 1, in an exemplary embodiment in whichthe controller 52 is formed separate from the temperature probe 10, thecontroller 52 may comprise a display 54 and one or more operatorinterfaces 56. The display 54 and operator interfaces 56 of thecontroller 52 may be structurally and/or functionally similar to thedisplay 54 and operator interfaces 22 of the handle 20 described herein.

The probe cover 30 may be substantially cylindrical, and may havesimilar dimensions to that of the shaft 18. For example, the probe cover30 may be incrementally longer than the shaft 18 so as to fit oversubstantially the entire shaft 18. The probe cover 30 may define anorifice 46 at a proximal end 42 thereof. Similar to the shaft 18, theprobe cover 30 may also define a substantially atraumatic tip 38 at adistal end 40 thereof. The probe cover 30 may be formed from anymedically approved material known in the art. Such materials mayinclude, for example, plastics, polymers, and/or any of the othermaterials discussed above with regard to the temperature probe 10. Usingsuch materials may enable, for example, the probe cover 30 to berepeatedly used and/or sanitized. Alternatively, in additional exemplaryembodiments, the probe cover 30 may be configured for one-time usage. Inexemplary embodiments, the probe cover 30 and/or portions thereof mayfunction as an optical filter. In such embodiments, portions of theprobe cover 30 may be tinted, textured, shaped, dimensioned, and/orotherwise configured to modify light and/or other radiation passingthrough the probe cover 30. In such embodiments, the portions of theprobe cover 30 functioning as an optical filter may assist incollimating, focusing, and/or otherwise directing radiation passingthrough the probe cover 30. For example, such portions of the probecover 30 may be configured to assist in maximizing the amount ofradiation passing through the probe cover 30, and on to the one or moresensors 32, 34, 35. In this way, such portions of the probe cover 30 mayimprove the functionality of such sensors sensors 32, 34, 35.

In additional exemplary embodiments, the probe cover 30 may include oneor more additional structures to facilitate usage with, insertion on,and/or removal from the temperature probe 10. For example, while theorifice 46 may be shaped, sized, and/or otherwise configured to acceptthe shaft 18 and to mate with one or more retention components 27 of thetemperature probe 10, in further exemplary embodiments, at least aportion of the proximal end 42 of the probe cover 30 may includeadditional notches, cutouts, tabs, ribs, rings, flanges, and/or otherretention components (not shown) configured to assist in connecting theprobe cover 30 to and/or disconnecting the probe cover 30 from thetemperature probe 10. For example, such retention components of theprobe cover 30 may mate with the retention components 27 of thetemperature probe 10 to facilitate retention of the probe cover 30 onthe shaft 18 and/or ejection of the probe cover 30 from the shaft 18.

As shown in FIGS. 11 and 13, exemplary embodiments of the probe cover 30may also include one or more features 37 shaped, sized, located, and/orotherwise configured to facilitate operation of the one or more sensors32, 34, 35. For example, such features 37 may comprise windows, lenses,and/or other like structures configured to facilitate passage ofradiation to a respective optical sensor 35, emission of an electricalfield by a respective capacitance sensor 34, and/or transmission ofthermal energy to a temperature sensor 32. In each of the exemplaryembodiments described herein, one or more of the features 37 maycomprise a groove, channel, trough, notch, cut-out, and/or other likestructure. In exemplary embodiments in which the temperature sensor 32comprises an infrared temperature sensor, such features 37 may beconfigured to facilitate passage of infrared radiation to and from sucha temperature sensor 32. In additional exemplary embodiments, thefeatures 37 may comprise a portion of the probe cover 30 that has beenremoved by laser etching, cutting, and/or other like methods. In stillfurther embodiments, the features 37 may comprise a portion of the probecover 30 having a wall thickness that is less than surrounding portionsand/or a remainder of the probe cover 30. In such embodiments, thefeatures 37 may be formed during the probe cover molding, extrusion,and/or other manufacturing process. For example, the features 37 may beformed into one or more of the molds used to manufacture the probe cover30.

As shown in FIGS. 11 and 13, the location of each feature 37 on theprobe cover 30 may correspond to the location of a respective one of thesensors 32, 34, 35 on the shaft 18, such that when the probe cover 30 isdisposed on the shaft 18, each feature 37 may be disposed proximateand/or substantially over a respective one of the sensors 32, 34, 35. Ineach of the exemplary embodiments described herein, one or more of thefeatures 37 may comprise a groove, channel, trough, notch, cut-out,and/or other like structure.

In further exemplary embodiments, at least one of the features 37 may beconfigured to modify radiation passing to a respective optical sensor35, an electrical field emitted by a respective capacitance sensor 34,and/or thermal energy transmitted to a temperature sensor 32. Forexample, in embodiments in which a feature 37 is disposed proximateand/or substantially over a capacitance sensor 34, the feature 37 may beconfigured to intensify, focus, direct, and/or otherwise affect theelectrical field emitted by the capacitance sensor 34. Such a feature 37may also be configured to enhance a sensitivity of the sensor 34,thereby improving the capability of the sensor 34 to determine acapacitance and/or a change in capacitance at the measurement site.

In additional exemplary embodiments, at least one of the features 37 maybe sized, shaped, located, and/or otherwise configured to assist indetermining the identity of the measurement site. For example, one ormore of the features 37 may be dimensioned such that portions of thepatient's anatomy found at a first measurement site may interact withthe feature 37 differently than portions of the patient's anatomy foundat a second measurement site. Such interaction may have a unique effecton the signals sent by a respective sensor 32, 34, 35 disposed beneathsuch a feature, and the controller 52 may be configured to determine theidentity of the measurement site based at least in part on such aneffect. For example, at least one of the features 37 may comprise one ormore longitudinal, radial, and/or other like grooves. In such anembodiment, a patient's tongue may be compliant enough to at leastpartially conform to and/or otherwise fill such grooves, while portionsof the axilla and/or rectum may not be as compliant. Accordingly, theinteraction between the patient's tongue and such a feature 37 mayaffect the capacitance and/or change in capacitance determined by arespective capacitance sensor 34 disposed beneath such a feature 37. Forinstance, such interaction may augment the capacitance and/or change incapacitance determined by the capacitance sensor 34 disposed beneathsuch a feature 37 by a known amount and/or in any other known way.Accordingly, the controller 52 may be configured to determine, amongother things, the identity of the measurement site (i.e., that thecapacitance sensor 34 and/or the shaft 18 of the temperature probe 10 isdisposed at or in the patient's mouth) based on signals received whileusing a probe cover 30 having such features 37. Although suchmeasurement site identity determinations have been described above withrespect to a capacitance sensor 34, in further exemplary embodiments,similar proximity and/or measurement site identity determinations may bemade using such features 37 in conjunction with one or more of thetemperature sensors 32, optical sensors 35, and/or other sensorsdescribed herein. In each of the exemplary embodiments described herein,such features 37 may be shaped, sized, located, and/or otherwiseconfigured such that epidermal and/or other tissue of the patient mayfit within at least a portion of one or more such features 37 to aid indetermining the identity of the measurement site, the proximity to themeasurement site, the temperature of the measurement site, and/or any ofthe other measurement site characteristics described herein.

In a similar manner, interaction between such features 37 and respectivesensors 32, 34, 35 may assist the controller 52 in determining the typeof probe cover 30 being used. For instance, such interaction may have aunique effect on the signals sent by a respective sensor 32, 34, 35disposed beneath such a feature, and the controller 52 may be configuredto determine the probe cover type and/or the probe cover manufacturerbased at least in part on such an effect. In exemplary embodiments, oneor more such features 37 may be shaped, sized, located, and/or otherwiseconfigured to be indicative of the particular type and/or manufacturerof the probe cover 30. In such embodiments, the controller 52 may beconfigured to determine whether the probe cover 30 being used is, forexample, of an approved probe cover type and/or from an approved probecover manufacturer based on signals received from respective sensors 32,34, 35 indicative of the characteristics of such features 37. Thecontroller 52 may also be configured to take further action based onsuch determinations. In exemplary embodiments, the controller 52 may beconfigured to permit activation and/or use of one or more of the sensors32, 34, 35 in response to determining that the probe cover 30 is of anapproved type and is from an approved probe cover manufacturer. On theother hand, the controller 52 may be configured to disable one or morecomponents of the temperature probe 10 in response to determining thateither the probe cover 30 is not of an approved type or that the probecover 30 is not from an approved probe cover manufacturer.

In still further exemplary embodiments, one or more additional sensors28 may be disposed on the temperature probe 10 at a location useful fordetecting the presence of the probe cover 30. For example, such sensors28 may be disposed proximate the base 24 of the shaft 18 and configuredto detect the proximal end 42 of the probe cover 30 once the shaft 18has been inserted into the probe cover 30. In still further exemplaryembodiments, such sensors 28 may be disposed proximate the tip 16 andconfigured to detect the distal end 40 of the probe cover 30 once theshaft 18 has been inserted into the probe cover 30. In such exemplaryembodiments, the one or more sensors 28 may comprise, for example, aproximity sensor and/or any other like sensing device, and sensing thefirst temperature indicative of a temperature of the probe cover 30 maybe performed in response to detecting the presence of the probe cover 30on the shaft 18. As shown in the exemplary embodiment of FIG. 13, inadditional exemplary embodiments, such an additional sensor may comprisean optical sensor 35 disposed on the temperature probe 10 such that theoptical sensor 35 is exposed to ambient light and/or other ambientconditions outside of the probe cover 30 when the probe cover 30 isdisposed on the shaft 18. Such an optical sensor 35 may be disposed onand/or proximate to, for example, the base 24 of the shaft 18.

The exemplary temperature measurement systems 100, 200, 300 of thepresent disclosure, shown in FIGS. 1, 11, and 13, respectively, mayinclude any of the temperature probes 10, controllers 52, and/or probecovers 30 described herein, as well as the various components thereof.In addition, exemplary temperature measurement systems 100, 200, 300 ofthe present disclosure may further include a storage container 58 (FIGS.3, 4, 6, and 7), and as mentioned above, one or more probe covers 30 maybe disposed within the storage container 58. The storage container 58may have any shape, size, and/or other configuration convenient forstoring a plurality of probe covers 30 therein. For example, the storagecontainer 58 may be substantially box shaped, and may have asubstantially rectangular, substantially square, and/or substantiallyhexagonal cross-sectional shape.

At least a portion of the storage container 58 may define one or moreopenings 60. Such exemplary openings 60 may be shaped, sized, located,and/or otherwise configured to assist in the removal of one or moreprobe covers 30 from the storage container 58. For example, such anopening 60 may be shaped and/or sized to permit passage of a probe cover30 for removal from the storage container 58. Such an opening 60 mayalso be shaped and/or sized to permit removal of only a single probecover 30 from the storage container 58 at one time. In such an exemplaryembodiment, the opening 60 may assist in retaining the remaining probecovers 30 within the storage container 58 while, at the same time,facilitating removal of a single probe cover 30 for use with thetemperature probe 10.

As shown in FIG. 3, the storage container 58 may include, for example, afront 66, a back 68, and at least two sides 70, 72. In additionalexemplary embodiments, it is understood that the storage container 58may include additional sides and/or other structures, depending upon,for example, the configuration of the probe covers 30 and/or storagerequirements related to the probe covers 30. As shown in FIG. 3, anexemplary storage container 58 may also include a top 62 and a bottomwall 64 disposed opposite the top 62. The front 66, back 68, and atleast two sides 70, 72 may be disposed orthogonal to the bottom wall 64.In an exemplary embodiment, the top 62 may define at least a portion ofthe opening 60. In additional exemplary embodiments, at least a portionof the top 62 may be removed to expose the opening 60, and in furtherexemplary embodiments, substantially the entire top 62 may be removedfrom the storage container 58. In such exemplary embodiments,substantially all of the probe covers 30 disposed within the storagecontainer 58 may be exposed for removal.

As can be seen via the opening 60 illustrated in FIG. 3, two or moreprobe covers 30 may be positioned adjacently within the storagecontainer 58. For example, two or more such probe covers 30 may besubstantially aligned along respective lengths thereof within thestorage container 58. In such exemplary embodiments, a plurality ofprobe covers 30 may be supported by, for example, the bottom wall 64 ofthe storage container 58, and may be arranged to stand within thestorage container 58 on the respective distal ends 40 thereof.

As shown in FIG. 4, the conductor 74 described above may be disposed onthe bottom wall 64 of the storage container 58, and the distal end 40 ofeach respective probe cover 30 disposed within the storage container 58may be in contact with the conductor 74. In exemplary embodiments, theconductor 74 may extend along the bottom wall 64 from the front 66 tothe back 68 of the storage container 58. The conductor 74 may alsoextend from the first side 70 to the second side 72 such that theconductor 74 covers substantially the entire bottom wall 64. AlthoughFIG. 4 illustrates the conductor 74 being disposed on an inner surfaceof the bottom wall 64, in additional exemplary embodiments, theconductor 74 may be disposed on an outer surface of the bottom wall 64.As discussed above, in still further exemplary embodiments, theconductor 74 may be formed integrally with the bottom wall 64.

As shown in at least FIG. 4, when the shaft 18 is disposed within theprobe cover 30 such that a capacitance sensor 34 is disposed adjacent toand/or in contact with the tip 38 of the probe cover 30, the capacitancesensor 34 may be configured to measure a change in capacitance resultingfrom the capacitance sensor 34 being separated from the conductor 74 bythe probe cover 30. For instance, the capacitance measured by thecapacitance sensor 34 when disposed as shown in FIG. 4 may be differentthan a capacitance measured if the capacitance sensor 34 of FIG. 4 wasdisposed in direct contact with the conductor 74 on the bottom wall 64.Although not described in greater detail herein, in further exemplaryembodiments the capacitance sensor 34 may be configured to measure achange in capacitance caused by relative movement between thecapacitance sensor 34 and the conductor 74.

The temperature probes 10, probe covers 30, and storage containers 58described herein may be utilized by physicians, nurses, and/or otherhealthcare professionals in a variety of different environments. Forexample, the devices and/or the temperature measurement systems 100,200, 300 described herein may be employed in any of a number ofexamination facilities to determine one or more temperatures associatedwith a patient, such as, for example, a core temperature of the patient.Such a temperature determination may be utilized by the healthcareprofessional to assist in treating the patient, and may have a varietyof uses that are well known in the medical field.

For example, the user may insert at least a portion of the temperatureprobe 10, such as the shaft 18, into the probe cover 30 via the orifice46. In an exemplary embodiment, the probe cover 30 may be disposedwithin a storage container 58 while the shaft 18 of the temperatureprobe 10 is inserted into the probe cover 30. In such an exemplaryembodiment, the probe cover 30 may be accessed through the opening 60 ofthe storage container 58 for insertion of the shaft 18. In such anexemplary embodiment, the temperature probe 10 may be moved in thedirection of arrow 50 (FIG. 1) relative to the probe cover 30 forinsertion. Alternatively, in exemplary embodiments in which the probecover 30 has been removed from the storage container 58 beforeconnection with the temperature probe 10, the probe cover 30 may bemoved in the direction of arrow 48 (FIG. 1) relative to the temperatureprobe 10 to facilitate a connection with the temperature probe 10.

As one or more of the retention components 27 of the temperature probe10 come into contact with the probe cover 30, such retention components27 may hook, clip, and/or otherwise mate with the proximal end 42 of theprobe cover 30 to assist in retaining the probe cover 30 on the shaft18. In exemplary embodiments in which the proximal end 42 of the probecover 30 defines one or more of the notches, cutouts, and/or otherretention components described above, the retention components of theprobe cover 30 may communicate with the retention components 27 of thetemperature probe 10 to assist in retaining the probe cover 30 thereon.

For example, the user may dispose the shaft 18 within the probe cover 30such that a capacitance sensor 34 disposed proximate the distal end 15of the shaft 18 is positioned proximate the distal end 40 of the probecover 30. The shaft 18, along with the probe cover 30, may then bedisposed within a body cavity and/or proximate to any other likemeasurement site of the patient, and the capacitance sensor 34 may beactivated to measure and/or otherwise determine a first capacitanceand/or a first change in capacitance associated with the body cavityand/or other measurement site. In such an exemplary embodiment, the bodycavity and/or measurement site may constitute a conductor 74, and avirtual capacitor may be formed by the capacitance sensor 34 and thebody cavity and/or measurement site.

For example, FIG. 2 illustrates an exemplary capacitance plotcorresponding to an embodiment of the temperature measurement system100, 200 in which a capacitance sensor 34 is disposed proximate thedistal end 15 of the shaft 18, and the conductor 74 comprises a bodycavity and/or other like measurement site of the patient. An exemplaryembodiment in which the conductor 74 comprises a body cavity and/orother measurement site of the patient, such as, for example, a mouth 96of the patient is illustrated in FIG. 10. In the exemplary embodimentshown in FIG. 10, the probe cover 30 may be disposed in contact with,for example, the tongue 92, and/or an internal mouth surface 94 of thepatient. In such exemplary embodiments, the tongue 92 and/or the mouthsurface 94 may comprise the conductor 74.

As shown in FIG. 2, one or more known and/or reference capacitancevalues may be stored in the memory of the controller 52. Such values maycorrespond to, for example, a capacitance sensed without a probe cover30 being disposed on the shaft 18 and the capacitance sensor 34 being indirect contact with the conductor 74 (e.g., 700 counts), a capacitancesensed with a reference probe cover 30 having a thickness of 0.010inches disposed on the shaft 18 (e.g., 400 counts), and a capacitancesensed with a reference probe cover 30 having a thickness of 0.015inches disposed on the shaft 18 (e.g., 380 counts). It is understoodthat the reference capacitance values corresponding to the 0.010-inchand 0.015-inch probe covers 30 may vary depending on, for example, thetype of conductor 74, the location of the capacitance sensor 34 relativeto the probe cover 30, the location of the capacitance sensor 34relative to the conductor 74, and/or other factors related to theparticular configuration of the temperature measurement system 100.

In the exemplary core temperature determination described above withrespect to FIG. 2, if the first capacitance determined by thecapacitance sensor 34 corresponds to a capacitance value of 387 counts,the controller 52 may determine a difference between the firstcapacitance and one of the stored reference capacitance values todetermine an unknown thickness of the probe cover 30. For example, thecontroller 52 may extrapolate between the two reference capacitancevalues discussed above to determine the thickness of the probe cover 30used during measurement of the first capacitance. In alternativeexemplary embodiments, the controller 52 may use any other knownmathematical and/or functional relationships to determine the thicknessof the probe cover 30, and in further exemplary embodiments, thecontroller 52 may use one or more stored look-up tables to determinesuch a thickness. This determined thickness may be used by thecontroller 52 as an input to a core temperature determination algorithm.For example, the controller 52 may determine the core temperature of thepatient based on the determined thickness of the probe cover 30 beingused as well as a temperature of the body cavity as measured by thetemperature sensor 32.

While the capacitance plot shown in FIG. 2 is illustrative of anexemplary embodiment, such as the embodiment shown in FIG. 10, in whichthe body cavity of the patient comprises the conductor 74, in furtherexemplary core temperature determination methods, a conductor 74disposed on the bottom wall 64 of the storage container 58 or on thebase 86 of a receptacle 84 may be used to measure a change incapacitance. For example, the capacitance plot shown in FIG. 5 isillustrative of the exemplary embodiment of FIG. 4 in which thecapacitance sensor 34 is disposed at the tip 16 of the shaft 18, the tip16 is disposed adjacent to the tip 38 of the probe cover 30, and thedistal end 40 of the probe cover 30 is in contact with a conductor 74disposed on the bottom wall 64 of the storage container 58. In such anexemplary embodiment, the capacitance sensor 34 may be separated fromthe conductor 74 by the relatively thin probe cover 30, and thecapacitance sensor 34 may measure a change in capacitance resulting fromthe capacitance sensor 34 being separated from the conductor 74 by thedistal end 40 of the probe cover 30. As shown in FIG. 5, in such anexemplary embodiment, an exemplary reference capacitance valuecorresponding to a 0.010-inch probe cover 30 may be 690 counts and anexemplary reference capacitance value corresponding to a 0.015-inchprobe cover 30 may be 680 counts. Such reference capacitance values maybe higher than, for example, the values discussed above with respect toFIG. 2 due to the type of conductor 74 shown in FIG. 4, and theproximity of the capacitance sensor 34 shown in FIG. 4 to the conductor74. In the exemplary embodiment of FIGS. 4 and 5, if the firstcapacitance determined by the capacitance sensor 34 corresponds to acapacitance value of 687 counts, the controller 52 may determine adifference between the first capacitance and one of the stored referencecapacitance values to determine an unknown thickness of the probe cover30. This process may be similar to the methods described above withregard to FIG. 2. Additionally, as described above with respect to FIG.2, the controller 52 may determine the core temperature of the patientbased on the determined thickness of the probe cover 30 as well as atemperature of the body cavity as measured by the temperature sensor 32.

The capacitance plot shown in FIG. 8 is illustrative of the exemplaryembodiment of FIG. 7 in which the capacitance sensor 34 is disposed atthe tip 16 of the shaft 18, the tip 16 is disposed adjacent to the tip38 of the probe cover 30, and the distal end 40 of the probe cover 30 isin contact with the bottom wall 64 of the storage container 58. Thebottom wall 64 is disposed on the base 86 of the receptacle 84, and theconductor is disposed on the inner surface 88 of the base 86. In thisexemplary embodiment, the capacitance sensor 34 is separated from theconductor 74 by the probe cover 30 and the bottom wall 64, and thecapacitance sensor 34 may measure a change in capacitance resulting fromthe capacitance sensor 34 being separated from the conductor 74 by thedistal end 40 of the probe cover 30 and the bottom wall 64. As shown inFIG. 8, in such an exemplary embodiment, an exemplary referencecapacitance value corresponding to a 0.010-inch probe cover 30 may be650 counts and an exemplary reference capacitance value corresponding toa 0.015-inch probe cover 30 may be 640 counts. While such referencecapacitance values may be higher than, for example, the values discussedabove with respect to FIG. 2, such values may be slightly lower than thevalues discussed above with respect to FIG. 5 due to the proximity ofthe capacitance sensor 34 shown in FIG. 7 to the conductor 74. In theexemplary embodiment of FIGS. 7 and 8, if the first capacitancedetermined by the capacitance sensor 34 corresponds to a capacitancevalue of 647 counts, the controller 52 may determine a differencebetween the first capacitance and one of the stored referencecapacitance values to determine an unknown thickness of the probe cover30. This process may be similar to the methods described above withregard to FIG. 2. Additionally, as described above with respect to FIG.2, the controller 52 may determine the core temperature of the patientbased on the determined thickness of the probe cover 30 as well as atemperature of the body cavity as measured by the temperature sensor 32.

In additional exemplary core temperature determination methods, aconductor 74 disposed at a proximal end of the shaft 18 may be used tomeasure a change in capacitance. For example, the capacitance plot shownin FIG. 5 may also be illustrative of the exemplary embodiment of FIG. 9in which the capacitance sensor 34 is disposed proximate the proximalend 13 of the shaft 18, such as on the base 24 of the shaft 18.Additionally, the conductor 74 may be a metallic ring encircling aportion of the proximal end 13. The conductor 74 may overlay a portionof the capacitance sensor 34, and the probe cover 30 may be disposed onthe shaft 18 between the capacitance sensor 34 and the conductor. Insuch an exemplary embodiment, the capacitance sensor 34 may be separatedfrom the conductor 74 by the relatively thin probe cover 30 and anadditional gap or clearance provided between the conductor 74 and theprobe cover 30 for connection and/or disconnection of the probe cover30. The capacitance sensor 34 may measure a change in capacitanceresulting from the probe cover 30 being disposed between the capacitancesensor 34 and the ring-shaped conductor 74. This process may be similarto the methods described above with regard to FIG. 2. Additionally, asdescribed above with respect to FIG. 2, the controller 52 may determinethe core temperature of the patient based on the determined thickness ofthe probe cover 30 as well as a temperature of the body cavity asmeasured by the temperature sensor 32.

FIG. 12 illustrates another exemplary capacitance plot corresponding toan embodiment of the temperature measurement system 200 in which acapacitance sensor 34 is disposed proximate the distal end 15 of theshaft 18. One or more additional capacitance sensors 34 may be disposedon the shaft 18 proximal to the capacitance sensor 34 disposed proximatethe distal end 15, and such an exemplary temperature measurement system200 is shown in FIG. 11. Such capacitance sensors 34 may be configuredto generate one or more signals indicative of at least one of aproximity to the patient measurement site and an identity of themeasurement site. For example, as illustrated by the capacitance plot ofFIG. 12, such sensors 34 may be configured to sense a plurality ofcapacitance values (i.e., values A-J shown in FIG. 12) and/or aplurality of changes in capacitance values, and the signals generated bythe capacitance sensors 34 may be indicative of such values. Thetemperature measurement system 200 of FIG. 12 may be configured todetermine a core temperature of the patient based on the one or moresuch signals generated by sensors 34 as well as signals generated by thetemperature sensor 32 indicative of a temperature associated with themeasurement site. As described above with respect to FIG. 2, in suchembodiments, the measurement site (not shown in FIGS. 11 and 12) maycomprise the conductor 74.

As shown in FIG. 12, one or more known and/or reference capacitancevalues may be stored in the memory of the controller 52. Such values maycorrespond to, for example, a capacitance sensed without a probe cover30 being disposed on the shaft 18 and the capacitance sensor 34 being indirect contact with the conductor 74 (e.g., 700 counts). The capacitancesensor 34 may also sense one or more capacitance values (e.g., valuesA-C) indicative of a change in capacitance once a probe cover 30 hasbeen disposed on the shaft 18. Values A-C may be representative ofcapacitance values (e.g., 650 counts, 645 counts, and 640 counts,respectively) corresponding to probe covers 30 having variousthicknesses. For example, a first capacitance value A may be sensedrelative to a conductor 74 while a probe cover 30 having a correspondingfirst thickness is disposed on the shaft 18. This first value A may begreater than, for example, a second capacitance value B sensed relativeto the same conductor 74 while a probe cover 30 having a correspondingsecond thickness less than the first thickness is disposed on the shaft18. Accordingly, the controller 52 may be configured to determinewhether a probe cover 30 is present on the shaft 18 based on adifference between the capacitance value sensed without a probe cover 30being disposed on the shaft (e.g., 700 counts) and one of thecapacitance values A-C. The controller 52 may also be configured todetermine a thickness, configuration, manufacturer, and/or type of probecover 30 disposed on the shaft 18 based on the variations in capacitancevalues A-C sensed while the probe cover 30 is on the shaft 18.

With continued reference to FIG. 12, once the probe cover 30 has beendisposed on the shaft 18, the one or more capacitance sensors 34 may beconfigured to determine the proximity to the measurement site as thetemperature probe 10 (i.e., the capacitance sensor 34) is moved towardand/or otherwise approaches the measurement site. For example, thecapacitance sensor 34 may sense one or more capacitance values (e.g.,values D-F) indicative of a change in capacitance as the temperatureprobe 10 is moved closer to the measurement site and/or any other likeconductor 74. Values D-F may be representative of capacitance values(e.g., 600 counts, 595 counts, and 590 counts, respectively)corresponding to decreasing respective distances between the sensor 34and the measurement site. For example, a first capacitance value D maybe sensed relative to the measurement site while the sensor 34 isdisposed at a first distance from the measurement site. This first valueD may be greater than, for example, a second capacitance value E sensedrelative to the same measurement site while the sensor 34 is disposed ata second distance from the measurement site less than the firstdistance. Accordingly, the controller 52 may be configured to determinea proximity of the temperature probe 10 (i.e., the capacitance sensor34) to the measurement site based on one or more such values D-F, andsuch proximity determinations may be made prior to contact between, forexample, the shaft 18 and the measurement site.

In exemplary embodiments, the controller 52 may be configured todetermine the proximity to the measurement site based on one or moredifferences between the respective capacitance values D-F and a knowncapacitance value indicative of the shaft 18, the capacitance sensor 34,and/or the temperature probe 10 being disposed substantially at themeasurement site. For example, one or more known capacitance values(e.g., values H-J) indicative of the temperature probe 10 being disposedin contact with different respective measurement sites may be stored ina memory of the controller 52. Values H-J may be representative of knowncapacitance values (e.g., 445 counts, 440 counts, and 435 counts,respectively) associated with the capacitance sensor 34 beingsubstantially in contact with different measurement sites (e.g., themouth, the axilla, and the rectum, respectively). In such embodiments,the controller 52 may determine a difference Δ₁ between the value D-Emeasured as the temperature probe 10 approaches the measurement site andone of the respective known values H-J. The controller 52 may beconfigured to determine a proximity to the respective measurement sitebased on such a difference. In such exemplary embodiments, thecontroller 52 may determine the difference Δ₁ between the value D-Emeasured as the temperature probe 10 approaches the measurement site andan average of the respective known values H-J.

Once the temperature probe 10 has been disposed substantially at themeasurement site, the shaft 18 may be placed into contact with themeasurement site. In exemplary embodiments in which the measurement sitecomprised, for example, the rectum or other like body cavities, aportion of the shaft 18 may be inserted into the measurement site tofacilitate temperature determination. In such embodiments, it isunderstood that a first capacitance sensor 34 disposed on the shaft 18proximate the tip 16 may determine a first capacitance value indicativeof a first depth of insertion of the shaft 18 at the measurement site. Asecond capacitance sensor 34 disposed on the shaft 18 proximal to thefirst capacitance sensor 34 may determine a second capacitance valueindicative of a second depth of insertion of the shaft 18 at themeasurement site. Such sensors 34 may send respective signals indicativeof these capacitance values to the controller 52, and the controller 52may determine a depth of insertion of the shaft 18 based on such signalsand/or capacitance values. For example, the controller 52 may determinethe depth of insertion based on a difference between such first andsecond capacitance values. Alternatively, the controller 52 mayinterpolate between such capacitance values and/or utilize suchcapacitance values as inputs to one or more insertion depth algorithmsin determining the depth of insertion. In further exemplary embodiments,the controller 52 may use one or more stored look-up tables and/or anyother known mathematical and/or functional relationships to determinethe depth of insertion. It is also understood that similar methods ofdetermining the depth of insertion may be employed in embodiments inwhich such sensors 34 comprise substantially linear capacitance sensors34.

With continued reference to FIG. 12, the controller 52 may also beconfigured to determine the identity of the measurement site based on acorrelation between a measured change in capacitance and a known changein capacitance associated with the measurement site of interest. Forexample, the capacitance sensor 34 may measure a change in capacitancewhen the temperature probe 10 (i.e., the sensor 34) is disposedsubstantially at the measurement site. The controller 52 may comparethis measured change in capacitance with one or more known changes incapacitance stored in a memory thereof, wherein each known change incapacitance is indicative of a different respective measurement site.The controller 52 may determine the identity of the measurement site inquestion by finding a strongest correlation (e.g., a smallestdifference) between the measured change in capacitance and the knownchanges in capacitance.

As shown in FIG. 12, in such embodiments the capacitance sensor 34 maybe configured to determine a capacitance value G associated with themeasurement site in question. The controller 52 may be configured todetermine a difference between such a value G and a plurality of knowncapacitance values, such as values H-J representative of knowncapacitance values associated with the capacitance sensor 34 beingsubstantially in contact with different measurement sites. In suchembodiments, the controller 52 may determine a difference Δ₂ between thevalue G measured while the temperature probe 10 is disposedsubstantially at the measurement site and one of the respective knownvalues H-J associated with the respective potential measurement site ofthe patient. The controller 52 may be configured to determine theidentity of the respective measurement site based on such a difference.For example, the controller may select one of the respective potentialmeasurement sites corresponding to a smallest determined difference Δ₂between the value G and each of the known values H-J. Alternatively, thecontroller 52 may interpolate between such capacitance values and/orutilize such capacitance values as inputs to one or more measurementsite identity algorithms in determining the identity of the measurementsite. In further exemplary embodiments, the controller 52 may use one ormore stored look-up tables and/or any other known mathematical and/orfunctional relationships to determine the identity of the measurementsite. In further exemplary embodiments, the controller 52 may beconfigured to determine whether the temperature probe 10 is properlypositioned at the measurement site. For example, before or afterdetermining the identity of the measurement site, the controller 52 maybe configured to evaluate the value G, measured while the temperatureprobe 10 is disposed substantially at the measurement site, to determinewhether the proximity between the measurement site and the shaft 18and/or the capacitance sensor 34 is sufficient for accurate temperaturemeasurements. In such embodiments, the controller 52 may evaluate thevalue G to determine whether the proximity between the measurement siteand the shaft 18 and/or the capacitance sensor 34 is sufficient foraccurate temperature measurements. If the controller 52 determines thatthe temperature probe 10 is not properly positioned at the measurementsite, the controller 52 may inform the user of such a determination viathe display 54.

In still further exemplary embodiments, the controller 52 may beconfigured to automatically select one or more temperature determinationalgorithms, modes of operation, and/or other like temperature probecontrol programs for use in determining the core temperature of thepatient, and this automatic selection may be based on the measurementsite determination. For example, in any of the embodiments describedherein, upon determining the identity of the measurement site, thecontroller 52 may select and/or activate one or more stored algorithmsassociated with the determined measurement site. Such algorithms may betuned and/or otherwise particularly tailored for use when thetemperature probe 10 is disposed at the associated measurement site.Thus, selecting and/or using such tailored algorithms in response todetermining the identity of the measurement site may increase theaccuracy of the core temperature determination.

FIGS. 14 and 15 illustrate exemplary voltage plots corresponding to afurther embodiment of the temperature measurement system 300 in which anoptical sensor 35 is disposed proximate the distal end 15 of the shaft18. One or more additional optical sensors 35 may be disposed on theshaft 18 proximal to the optical sensor 35 disposed proximate the distalend 15, and such an exemplary temperature measurement system 300 isshown in FIG. 13. Such optical sensors 35 may be configured to generateone or more signals indicative of at least one of a proximity to thepatient measurement site and an identity of the measurement site. Forexample, such sensors 35 may be configured to sense a plurality ofvalues indicative of an amount of radiation received by the sensor 35,and/or a plurality of values indicative of a change in the amount ofradiation received thereby, and the signals generated by the opticalsensors 35 may be indicative of such values. Each such value maycorrespond to a unique respective voltage, and such exemplary voltagesL-U are illustrated in the voltage plot of FIG. 14. The temperaturemeasurement system 300 of FIG. 13 may be configured to determine a coretemperature of the patient based on the one or more such signalsgenerated by sensors 35 as well as signals generated by the temperaturesensor 32 indicative of a temperature associated with the measurementsite. In practice, the operation of system 300 shown in FIG. 13 may besubstantially similar to the operation of system 200 described abovewith respect to FIGS. 11 and 12. Accordingly, a summary of the operationof system 300 shall be described below with reference to the voltageplots of FIGS. 14 and 15.

As shown in FIG. 14, one or more known and/or reference voltages may bestored in the memory of the controller 52. Such voltages may correspondto, for example, an amount of radiation, such as visible light, sensedand/or received by the respective optical sensor 35 without a probecover 30 being disposed on the shaft 18 and the optical sensor 35 beingexposed to ambient conditions (e.g., 1.0 volt). The optical sensor 35may also sense an amount of radiation and/or a change in the amount ofradiation received by the sensor 35 once a probe cover 30 has beendisposed on the shaft 18. Voltages L-N may be representative of and/ormay otherwise correspond to such amounts of radiation and/or changes inthe amount of radiation received by the sensor 35. Each voltage L-N maycorrespond to a respective probe cover 30 having a unique thickness,opacity, and/or other like identifiable characteristic. For example, afirst amount of radiation corresponding to a voltage L may be sensedwhile a probe cover 30 having a corresponding first thickness, opacity,and/or other like identifiable characteristic is disposed on the shaft18. This first voltage L may be greater than, for example, a secondvoltage M corresponding to an amount of radiation received by the sensor35 while a probe cover 30 having a corresponding second thickness,opacity, and/or other like characteristic less than the firstcharacteristic is disposed on the shaft 18. Accordingly, the controller52 may be configured to determine whether a probe cover 30 is present onthe shaft 18 based on a difference between a voltage corresponding tothe amount of radiation sensed without a probe cover 30 being disposedon the shaft (e.g., 1.0 volt) and one of the voltages L-N. In exemplaryembodiments, while determining whether a probe cover 30 is present onthe shaft 18, at least one of the optical sensors 35 may be disposedbeneath the probe cover 30 when the probe cover 30 is disposed on theshaft 18, and at least one sensor 35 may be exposed to ambientconditions outside of the probe cover 30 when the probe cover 30 isdisposed on the shaft 18. The controller 52 may also be configured todetermine a thickness, configuration, manufacturer, and/or type of probecover 30 disposed on the shaft 18 based on the particular voltage L-Nsensed while the probe cover 30 is on the shaft 18.

With continued reference to FIG. 14, once the probe cover 30 has beendisposed on the shaft 18, the one or more optical sensors 35 may beconfigured to determine the proximity to the measurement site as thetemperature probe 10 (i.e., the optical sensor 35) is moved towardand/or otherwise approaches the measurement site. For example, theoptical sensor 35 may sense values indicative of an amount of radiationreceived and/or a change in the amount of radiation received as thetemperature probe 10 approaches the measurement site. The exemplaryvoltages O-Q shown in FIG. 14 correspond to amounts of light and/orchanges in the amount of light received by the sensor 35 as the distancebetween the sensor 35 and the measurement site decreases. For example, afirst voltage O may be indicative of an amount of radiation sensed whilethe sensor 35 is disposed at a first distance from the measurement site.This first voltage O may be greater than, for example, a second voltageP sensed while the sensor 35 is disposed at a second distance from themeasurement site less than the first distance. Accordingly, thecontroller 52 may be configured to determine a proximity of thetemperature probe 10 (i.e., the optical sensor 35) to the measurementsite based on one or more such values O-Q, and such proximitydeterminations may be made prior to contact between, for example, theshaft 18 and the measurement site.

In exemplary embodiments, the controller 52 may be configured todetermine the proximity to the measurement site based on one or moredifferences between the respective voltages O-Q and a known voltageindicative of the shaft 18, the optical sensor 35, and/or thetemperature probe 10 being disposed substantially at the measurementsite. For example, one or more known voltages (e.g., S-U) indicative ofan amount of radiation and/or a change in an amount of radiationreceived by the sensor 35 when the temperature probe 10 is disposed incontact with different respective measurement sites may be stored in amemory of the controller 52. Voltages S-U may be associated with theoptical sensor 35 being substantially in contact with differentrespective measurement sites (e.g., the mouth, the axilla, and therectum, respectively). In such embodiments, the controller 52 maydetermine a difference Δ₃ between the voltage O-Q and one of therespective known voltages S-U. The controller 52 may be configured todetermine a proximity to the respective measurement site based on such adifference. In such exemplary embodiments, the controller 52 maydetermine the difference Δ₃ between the voltage O-Q associated with thetemperature probe 10 approaching the measurement site and an average ofthe respective known voltages S-U.

Once the temperature probe 10 has been disposed substantially at themeasurement site, a portion of the shaft 18 may be inserted into themeasurement site to facilitate temperature determination. In suchembodiments, a first optical sensor 35 disposed on the shaft 18proximate the tip 16 may sense a first amount of radiation indicative ofa first depth of insertion of the shaft 18 at the measurement site. Asecond optical sensor 35 disposed on the shaft 18 proximal to the firstoptical sensor 35 may sense a second amount of radiation indicative of asecond depth of insertion of the shaft 18 at the measurement site. Suchsensors 35 may send respective signals indicative of these radiationamounts to the controller 52, and the controller 52 may determine adepth of insertion of the shaft 18 based on such signals and/or voltagescorresponding to values indicative of the sensed amounts of radiation.Any similar depth algorithms, look-up tables, and/or other knownmathematical and/or functional relationships described above withrespect to FIG. 12 may be used to determine the depth of insertion.

With continued reference to FIG. 14, the controller 52 may also beconfigured to determine the identity of the measurement site based on acorrelation between a measured amount of radiation and/or change in theamount of radiation received by the optical sensor 35 and a known amountand/or change in the amount of radiation associated with the particularmeasurement site of interest. For example, the optical sensor 35 may beconfigured to determine a value indicative of an amount of light and/orother radiation received when the optical sensor 35 is disposed at themeasurement site. The exemplary voltage R shown in FIG. 14 maycorrespond to such a value. The controller 52 may be configured todetermine a difference between such a value and a plurality of knownvalues associated with a respective potential measurement site of thepatient. Such known values may be represented by the voltages S-Udescribed above, and such voltages S-U may be representative of knownvoltages associated with the optical sensor 35 being substantially incontact with different measurement sites. In such embodiments, thecontroller 52 may determine a difference Δ₄ between, for example, thevalue indicative of the amount of radiation received when the opticalsensor 35 is disposed at the measurement site and one of the respectiveknown values associated with the respective potential measurement siteof the patient. For example, the controller 52 may determine thedifference Δ₄ between the voltage R and one of the voltages S-U. Thecontroller 52 may be configured to determine the identity of therespective measurement site based on such a difference. For example, thecontroller 52 may select one of the respective potential measurementsites corresponding to a smallest determined difference Δ₄.Alternatively, the controller 52 may utilize a measurement site identityalgorithm, look-up table, and/or any other mathematical and/orfunctional relationship similar to that described above with respect toFIG. 12 to determine the identity of the measurement site. It is alsounderstood that the controller 52 may utilize the voltage R, and/or itscorresponding value indicative of an amount of light and/or otherradiation received, to assist in determining whether the temperatureprobe 10 is properly positioned at the measurement site. For example,similar to the process described above with respect to FIG. 12, beforeor after determining the identity of the measurement site, thecontroller 52 may be configured to evaluate the value R, measured whilethe temperature probe 10 is disposed substantially at the measurementsite, to determine whether the proximity between the measurement siteand the shaft 18 and/or the optical sensor 35 is sufficient for accuratemeasurements. If, based on this analysis, the controller 52 determinesthat the temperature probe 10 is not properly positioned at themeasurement site, the controller 52 may inform the user of such adetermination via the display 54.

Further, the voltage plot of FIG. 15 illustrates a plurality of voltagesand changes in voltages corresponding to amounts of radiation receivedby the optical sensor 35 during use. In particular, as the shaft 18 isinserted into a probe cover 30 disposed within a storage container 58 ofthe present disclosure, the sensor 35 may determine a first change inthe amount of radiation received by the sensor 35. This first change inradiation received, represented by Δ₅ shown in FIG. 15, may result from,for example, the shaft 18 being inserted into the probe cover 30 whilethe probe cover 30 is disposed within the storage container 58.Accordingly, the first change in radiation received Δ₅ may result from achange in operating conditions where the sensor 35 transitions fromreceiving unobstructed ambient light with no cover disposed on the shaft18 to receiving minimal amounts of light within the storage container58.

Once the shaft 18 is removed from the storage container 58 with theprobe cover 30 disposed on the shaft 18, the sensor 35 may measure asecond change in radiation received Δ₆. This second change in radiationreceived Δ₆ may correspond to an increase in the amount of radiationreceived by the sensor 35. In particular, the second change in radiationreceived Δ₆ may result from a change in operating conditions in whichthe sensor 35 transitions from receiving minimal amounts of light withinthe storage container 58 to receiving ambient light through the probecover 30 outside of the storage container 58.

As the sensor 35 is disposed at the measurement site, the sensor 35 maymeasure a third change in radiation received Δ₇. This third change inradiation received Δ₇ may correspond to a decrease in the amount ofradiation received by the sensor 35. In particular, the third change inradiation received Δ₇ may result from a change in operating conditionsin which the sensor 35 transitions from receiving minimal amounts oflight within the storage container 58 to receiving relatively highamounts of ambient light through the probe cover 30 outside of thestorage container 58 to receiving reduced amounts of ambient light atthe measurement site. For example, in embodiments in which a portion ofthe shaft 18 is disposed within the mouth, axilla, rectum, and/or otherlike body cavity, the amount of ambient light received by the sensor 35may be greatly reduced. In exemplary embodiments, the controller 52 maydetermine a core temperature of the patient based on a temperatureassociated with the measurement site, measured by the temperature sensor32, and at least one of the first, second, and third changes inradiation Δ₅, Δ₆, Δ₇ described above. Further, it is understood that thecore temperature determination methods described herein with respect toFIG. 15 may be combined, in whole or in part, with one or more of theprocesses described above with respect to FIGS. 12 and 14.

In the exemplary core temperature determination methods describedherein, the sensor 32 may be activated to sense a temperature of thebody cavity while the shaft 18 is disposed within the body cavity and/orat any other like measurement site of the patient. For example, in anembodiment in which the first sensor 32 comprises a thermocouple and/ora thermistor, the first sensor 32 may be utilized to measure thetemperature of the body cavity. Further, in any of the exemplaryembodiments described herein, sensing the body cavity temperature may besensed by activating one or more infrared temperature sensors of thetemperature probe 10, such as one or more of the thermopiles describedabove.

Signals indicative of the measured change in capacitance, the measuredchange in the amount of radiation received, and/or the measured bodycavity temperature may be sent to the controller 52 by the varioussensors 32, 34, 35 described herein, and the controller 52 may assist indetermining the core temperature based on such parameters. For example,determining the thickness of the probe cover 30 based on the sensedcapacitance change may assist in accurately determining such a coretemperature. In exemplary embodiments, such capacitance and acorresponding thickness of the probe cover 30 may be utilized in thecore temperature calculation to reduce error. In further exemplaryembodiments, the determined proximity to the measurement site, identityof the measurement site, and/or probe cover type may also be utilized inthe core temperature determination to further reduce error. Such erroris commonly caused by using an inaccurate estimate of probe coverthickness and a corresponding inaccurate effect of such thickness on themeasured body cavity temperature. It is understood that even smalldiscrepancies between the actual and estimated probe cover thickness mayhave a dramatic effect on the resulting core temperature determined bythe controller 52. It is also understood that incorporating informationassociated with the determined proximity to the measurement site,identity of the measurement site, and/or probe cover type may enhancethe accuracy and reliability of the core temperature determination, andmay further reduce such error.

Other embodiments of the invention will be apparent to those skilled inthe art from consideration of the specification and practice of theinvention disclosed herein. It is intended that the specification andexamples be considered as exemplary only, with a true scope and spiritof the invention being indicated by the following claims.

What is claimed is:
 1. A temperature probe, comprising: a shaft having adistal end, a proximal end, and a tip at the distal end; a first sensordisposed on the shaft, the first sensor configured to measure acapacitance value associated with a measurement site of a patient, andto generate a first signal, based on the capacitance value, indicativeof at least one of a proximity to the measurement site and an identityof the measurement site; a second sensor disposed on the shaft, thesecond sensor configured to generate a second signal indicative of atemperature associated with the measurement site; and a controller incommunication with the first and second sensors, the controllerconfigured to: receive the first and second signals, determine adifference between the capacitance value and a known capacitance value,and determine a core temperature of the patient based on the differenceand the second signal.
 2. The temperature probe of claim 1, wherein thefirst sensor comprises a capacitance sensor configured to determine achange in capacitance as the capacitance sensor approaches themeasurement site, the first signal being indicative of the change incapacitance, and the controller being configured to determine the atleast one of the proximity to the measurement site and the identity ofthe measurement site based on the change in capacitance.
 3. Thetemperature probe of claim 2, wherein the controller is configured todetermine the proximity to the measurement site based on a differencebetween the capacitance value and a capacitance value indicative of theshaft being disposed substantially at the measurement site.
 4. Thetemperature probe of claim 2, wherein the controller is configured todetermine the proximity to the measurement site prior to contact betweenthe shaft and the measurement site.
 5. The temperature probe of claim 2,wherein the capacitance sensor comprises a first sensing device disposedon the shaft, and a second sensing device disposed on the shaft proximalto the first sensing device, the first sensing device being configuredto determine a first depth of insertion of the shaft at the measurementsite, and the second sensing device being configured to determine asecond depth of insertion of the shaft at the measurement site greaterthan the first depth.
 6. The temperature probe of claim 1, wherein thefirst sensor comprises a capacitance sensor configured to determine achange in capacitance, the first signal being indicative of the changein capacitance, and the controller being configured to determine thepresence of a cover on the shaft based on the change in capacitance. 7.The temperature probe of claim 2, wherein the controller is configuredto determine the identity of the measurement site by: determiningdifferences between the capacitance value and a plurality of knowncapacitance values, each value of the plurality of known capacitancevalues being associated with a respective potential measurement site ofthe patient, and selecting one of the respective potential measurementsites of the patient corresponding to a smallest determined difference.8. The temperature probe of claim 2, wherein the controller isconfigured to determine the identity of the measurement site based on acorrelation between the change in capacitance and a known change incapacitance associated with the measurement site.
 9. The temperatureprobe of claim 1, wherein the probe includes an optical sensorconfigured to determine a change in an amount of radiation received bythe optical sensor as the optical sensor approaches the measurementsite, the first signal being indicative of the change in the amount ofradiation, and the controller being configured to determine the at leastone of the proximity to the measurement site and the identity of themeasurement site based on the change in the amount of radiation.
 10. Thetemperature probe of claim 9, wherein the optical sensor comprises aphotodiode configured to determine a change in an amount of lightreceived by the photodiode, the first signal being indicative of thechange in the amount of light.
 11. The temperature probe of claim 10,wherein the optical sensor comprises a first photodiode disposedproximate the distal end of the shaft, and a second photodiode disposedproximal to the first photodiode, the controller being configured todetermine the presence of the probe cover based on a difference betweena first amount of light received by the first photodiode and a secondamount of light received by the second photodiode.
 12. The temperatureprobe of claim 11, wherein the first photodiode is disposed beneath theprobe cover when the probe cover is disposed on the shaft, and thesecond photodiode is exposed to ambient conditions outside of the probecover when the probe cover is disposed on the shaft.
 13. The temperatureprobe of claim 10, wherein the controller is configured to determine aprobe cover type associated with the probe cover based on the change inthe amount of light received.
 14. The temperature probe of claim 9,wherein determining the identity of the measurement site comprisesdetermining a value indicative of an amount of light received by theoptical sensor at the measurement site, determining differences betweenthe value indicative of the amount of light received by the opticalsensor at the measurement site and a plurality of known values, eachvalue of the plurality of known values being associated with arespective potential measurement site of the patient, and selecting oneof the respective potential measurement sites of the patientcorresponding to a smallest determined difference.
 15. The temperatureprobe of claim 9, wherein the controller is configured to determine theproximity to the measurement site based on a difference between a valueindicative of an amount of light received by the optical sensor and aknown value indicative of the shaft being disposed substantially at themeasurement site.
 16. The temperature probe of claim 9, wherein theoptical sensor comprises a first sensing device disposed on the shaft,and a second sensing device disposed on the shaft proximal to the firstsensing device, the first sensing device being configured to determine afirst depth of insertion of the shaft at the measurement site, and thesecond sensing device being configured to determine a second depth ofinsertion of the shaft at the measurement site greater than the firstdepth.
 17. A method of determining a core temperature of a patient,comprising: determining, with a first sensor, a parameter associatedwith a measurement site of the patient, wherein the parameter comprisesat least one of a change in capacitance and a change in an amount ofradiation received by the first sensor; determining at least one of aproximity to the measurement site and an identity of the measurementsite based on the parameter; determining, with a second sensor, atemperature associated with the measurement site; and determining thecore temperature of the patient based on the temperature associated withthe measurement site, and the at least one of the proximity to themeasurement site and the identity of the measurement site, wherein adifference between the change in capacitance and a known change incapacitance associated with the measurement site is used as an input indetermining the core temperature.
 18. The method of claim 17, whereindetermining the proximity to the measurement site includes determining,with the first sensor, a capacitance value associated with themeasurement site, and determining a difference between the capacitancevalue and a first capacitance value indicative of the first sensor beingdisposed substantially at the measurement site.
 19. The method of claim17, wherein the first sensor comprises a capacitance sensor disposed ona shaft of a temperature probe, the method further including determiningthe proximity to the measurement site prior to contacting themeasurement site with the shaft.
 20. The method of claim 17, furtherincluding determining the identity of the measurement site based on acorrelation between the change in capacitance determined with the firstsensor and the known change in capacitance associated with themeasurement site.
 21. The method of claim 17, wherein determining theidentity of the measurement site includes determining a capacitancevalue associated with the measurement site, determining differencesbetween the capacitance value associated with the measurement site and aplurality of known capacitance values, each value of the plurality ofknown capacitance values being associated with a respective potentialmeasurement site of the patient, and selecting one of the respectivepotential measurement sites of the patient corresponding to a smallestdetermined difference.
 22. The method of claim 17, wherein the radiationcomprises light, the method further including determining a change in anamount of light received by the first sensor as the first sensorapproaches the measurement site, and determining the at least one of theproximity to the measurement site and the identity of the measurementsite based on the change in the amount of light.
 23. The method of claim22, wherein the first sensor is disposed on a shaft of a temperatureprobe, the method further including determining the presence of a probecover on the shaft based on the change in the amount of light received.24. The method of claim 23, further including determining a probe covertype associated with the probe cover based on the change in the amountof light received.
 25. The method of claim 17, wherein the first sensorcomprises a capacitance sensor disposed on a shaft of a temperatureprobe, the method further including determining an additional change incapacitance with the first sensor and determining the presence of aprobe cover on the shaft based on the additional change in capacitance.26. A temperature probe, comprising: a shaft having a distal end, aproximal end, and a tip at the distal end; a first sensor disposed onthe shaft, the first sensor configured to generate a first signalindicative of an identity of the measurement site; a second sensordisposed on the shaft, the second sensor configured to generate a secondsignal indicative of a temperature associated with the measurement site;and a controller in communication with the first and second sensors, thecontroller configured to receive the first and second signals, anddetermine a core temperature of the patient based on the first andsecond signals, wherein the temperature probe is configured to determinethe identity of the measurement site by: determining a value indicativeof an amount of light received by at least one sensor associated withthe probe, wherein the light is received as the at least one sensorapproaches the measurement site, determining differences between thevalue indicative of the amount of light received and a plurality ofknown values, each value of the plurality of known values beingassociated with a respective potential measurement site of the patient,and selecting one of the respective potential measurement sites of thepatient based on at least one of the determined differences.
 27. Thetemperature probe of claim 26, wherein the identity of the measurementsite is selected from a group consisting of a mouth, an axilla, arectum, and an ear drum.